NIKON METROLOGY XTH 225 ST, Micro Focus X-Ray & CT Inspection System

NIKON METROLOGY XTH 225 ST, Micro Focus X-Ray & CT Inspection System View Large Image
XTH 225 ST

The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments. 

Key benefits

  • Proprietary 225kV microfocus X-ray source with 3µm focal spot size
  • Easy system operation
  • Stunning images providing maximum insight
  • High performance image acquisition and volume processing
  • Straightforward inspection automation
  • Safety by design
  • Low cost-of-ownership

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