The XTV-160, also known as the Revolution, has been developed utilizing NIKONS 20 years experience in nanofocus X-ray technology. The system provides the highest resolution and magnification possible within a compact system and is ideally suited for inspection of electronic components in production lines and failure analysis laboratories. The XT V 160 is a versatile tool that allows an operator to easily make use of the system’s manual and programmable inspection capabilities.
On top of it is ready for Computed Tomography CT inspection to reconstruct the test sample in full 3D image.Designed for 100% BGA and µBGA inspection, multilayer board inspection and PCB solder joint inspection, it is a simple to use, high resolution and cost-effective inspection solution that is an indispensable workhorse for any inspection lab.
Maximum magnification - 6000x
High resolution - Micron level features
High penetration - 160kV
True concentric imaging
True parallel tracking for BGA applications
Advanced ergonomics
Integrated Inspect-X Software
Footprint efficient
Low cost of ownership